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Characterisation of GaAs/AlGaAs heterostructures grown by OMVPE using trimethylamine alane as a new alu-minum source

Author(s):
Hobson,W.S.
McAfee,S.R.
Jones,K.S.
Paroskevopoulos,N.C.
Abernathy,C.R.
Sputz,S.K.
Harris,T.D.
Schnoes,M.Lamont
Pearton,S.J.
4 more
Publication title:
Proceedings of the 16th International Conference on Defects in Semiconductors : Lehigh University, Bethlehem, Pennsylvania, 22-26 July 1991
Title of ser.:
Materials science forum
Ser. no.:
83-87
Pub. date:
1992
Vol.:
Pt.2
Page(from):
1063
Page(to):
1068
Pub. info.:
Zurich, Switzerland: Trans Tech Publications
ISSN:
02555476
ISBN:
9780878496280 [0878496289]
Language:
English
Call no.:
M23650
Type:
Conference Proceedings

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