Blank Cover Image

The isolated arsenic antisite defect and EL2-an ODMR investigation of electron irradiated GaAs

Author(s):
Publication title:
Proceedings of the 16th International Conference on Defects in Semiconductors : Lehigh University, Bethlehem, Pennsylvania, 22-26 July 1991
Title of ser.:
Materials science forum
Ser. no.:
83-87
Pub. date:
1992
Vol.:
Pt.2
Page(from):
887
Page(to):
892
Pub. info.:
Zurich, Switzerland: Trans Tech Publications
ISSN:
02555476
ISBN:
9780878496280 [0878496289]
Language:
English
Call no.:
M23650
Type:
Conference Proceedings

Similar Items:

Bardeleben,H.J.von, Delerue,C., Stievenard,D.

Trans Tech Publications

HOFMANN,D.M., SPAETH,J.-M., MAYER,B.K.

Trans Tech Publications

Krambrock,K., Meyer,B.K., Spaeth,J.-M.

Trans Tech Publications

Goodrnan,S.A., Koschnick,F.K., Weber,Ch., Spaeth,J .-M., Auret,F.D.

Trans Tech Publications

Krambrock,K., Corbel,C., Spaeth,J.-M.

Trans Tech Publications

Bardeleben,H.J.von, Bourgoin,J.C., Stievenard,D.

Trans Tech Publications

Roos,G., Schbner,A., Pensl,G., Krambrock,K., Meyer,B.K., Spaeth,J.-M., Wagner,J.

Trans Tech Publications

Wietzke,K.-H., Pinheiro,M.V.B., Koschnick,F.K., Krambrock,K., Spaeth,J.-M.

Trans Tech Publications

Krambrock,K., Pinheiro,M.V.B., Madeiros,S.M.

Trans Tech Publications

Wietzke,K.-H., Koschnick,F.K., Spaeth,J.-M.

Trans Tech Publications

Feenstra,R.M., Woodall,J.M., Pettit,G.D.

Trans Tech Publications

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12