Correlation effects due to ionized defects in semiconductors

Author(s):

• Wilamowski,Z.
• Jantsch,W.
• Ostermayer,G.
• Kossut,J.

Publication title:

Proceedings of the 16th International Conference on Defects in Semiconductors : Lehigh University, Bethlehem, Pennsylvania, 22-26 July 1991

Title of ser.:

Materials science forum

Ser. no.:

83-87

Pub. Year:

1992

Vol.:

Pt.2

Page(from):

805

Page(to):

816

Pub. info.:

Zurich, Switzerland: Trans Tech Publications

ISSN:

02555476

ISBN:

9780878496280 [0878496289]

Language:

English

Call no.:

M23650

Type:

Conference Proceedings