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Vibrational mode Fourier transform spectroscopy with a diamond anvil cell:modes ofthe Si DX center and S related centers in GaAs

Author(s):
Wolk,J.A.
Kruger,M.B.
Heyman,J.N.
Beeman,J.W.
Gui-iron,J.G.
Bourret,E.D.
Walukiewicz,W.W.
Jeanloz,R.
Haller,E.E.
4 more
Publication title:
Proceedings of the 16th International Conference on Defects in Semiconductors : Lehigh University, Bethlehem, Pennsylvania, 22-26 July 1991
Title of ser.:
Materials science forum
Ser. no.:
83-87
Pub. Year:
1992
Vol.:
Pt.2
Page(from):
757
Page(to):
762
Pub. info.:
Zurich, Switzerland: Trans Tech Publications
ISSN:
02555476
ISBN:
9780878496280 [0878496289]
Language:
English
Call no.:
M23650
Type:
Conference Proceedings

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