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Magnetic resonance from a metastable sulfur-pair-related complex defect in silicon

Author(s):
Chen,W.M.
Singh,M.
Henry,A.
Janzen,E.
Monemar,B.
Frens,A.M.
Bennebroek,M.T.
Schmidt,J.
Reeson,K.J.
Gwilliam,R.M.
5 more
Publication title:
Proceedings of the 16th International Conference on Defects in Semiconductors : Lehigh University, Bethlehem, Pennsylvania, 22-26 July 1991
Title of ser.:
Materials science forum
Ser. no.:
83-87
Pub. Year:
1992
Vol.:
Pt.1
Page(from):
251
Page(to):
256
Pub. info.:
Zurich, Switzerland: Trans Tech Publications
ISSN:
02555476
ISBN:
9780878496280 [0878496289]
Language:
English
Call no.:
M23650
Type:
Conference Proceedings

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