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Transition-metal acceptor pairs in silicon

Author(s):
Emanuelsson,P.
Omling,P.
Grimmeiss,H.G.
Cehlhoff,W.
Kreissl,J.
Irmscher,K.
Rehse,U.
2 more
Publication title:
Proceedings of the 16th International Conference on Defects in Semiconductors : Lehigh University, Bethlehem, Pennsylvania, 22-26 July 1991
Title of ser.:
Materials science forum
Ser. no.:
83-87
Pub. date:
1992
Vol.:
Pt.1
Page(from):
137
Page(to):
142
Pub. info.:
Zurich, Switzerland: Trans Tech Publications
ISSN:
02555476
ISBN:
9780878496280 [0878496289]
Language:
English
Call no.:
M23650
Type:
Conference Proceedings

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