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X ray fills the gap

Author(s):
Wasik,C. ( Lockheed Martin Federal Systems and IBM Microelectronics Div. )
Murphy,G.P. ( Lockheed Martin Federal Systems and IBM Microelectronics Div. )
Chen,A.C. ( Lockheed Martin Federal Systems and IBM Microelectronics Div. )
Krasnoperova,A.A. ( Lockheed Martin Federal Systems and IBM Microelectronics Div. )
Flamholz,A.L. ( Lockheed Martin Federal Systems and IBM Microelectronics Div. )
DeMay,D.D. ( Lockheed Martin Federal Systems and IBM Microelectronics Div. )
Leavey,J.A. ( IBM Microelectronics Div. )
Loh,S. ( IBM Microelectronics Div. )
Chaloux,S. ( IBM Microelectronics Div. )
Thomas,A.C. ( IBM Microelectronics Div. )
Lee,S. ( IBM Microelectronics Div. )
Giewont,K.J. ( IBM Microelectronics Div. )
Agnello,P.D. ( IBM Microelectronics Div. )
8 more
Publication title:
Emerging lithographic technologies II : 23-25 February 1998, Santa Clara, California
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
3331
Pub. Year:
1998
Page(from):
150
Page(to):
156
Pub. info.:
Bellingham, Wash., USA: SPIE-The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819427762 [0819427764]
Language:
English
Call no.:
P63600/3331
Type:
Conference Proceedings

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