X ray fills the gap
- Author(s):
Wasik,C. ( Lockheed Martin Federal Systems and IBM Microelectronics Div. ) Murphy,G.P. ( Lockheed Martin Federal Systems and IBM Microelectronics Div. ) Chen,A.C. ( Lockheed Martin Federal Systems and IBM Microelectronics Div. ) Krasnoperova,A.A. ( Lockheed Martin Federal Systems and IBM Microelectronics Div. ) Flamholz,A.L. ( Lockheed Martin Federal Systems and IBM Microelectronics Div. ) DeMay,D.D. ( Lockheed Martin Federal Systems and IBM Microelectronics Div. ) Leavey,J.A. ( IBM Microelectronics Div. ) Loh,S. ( IBM Microelectronics Div. ) Chaloux,S. ( IBM Microelectronics Div. ) Thomas,A.C. ( IBM Microelectronics Div. ) Lee,S. ( IBM Microelectronics Div. ) Giewont,K.J. ( IBM Microelectronics Div. ) Agnello,P.D. ( IBM Microelectronics Div. ) - Publication title:
- Emerging lithographic technologies II : 23-25 February 1998, Santa Clara, California
- Title of ser.:
- Proceedings of SPIE - the International Society for Optical Engineering
- Ser. no.:
- 3331
- Pub. Year:
- 1998
- Page(from):
- 150
- Page(to):
- 156
- Pub. info.:
- Bellingham, Wash., USA: SPIE-The International Society for Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819427762 [0819427764]
- Language:
- English
- Call no.:
- P63600/3331
- Type:
- Conference Proceedings
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