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Miniature CRT with high brightness and precision as well as its application in testing of the visible imaging seeker

Author(s):
  • Zhang,W. ( Harbin Institute of Technology (China) )
  • Jin,H. ( Harbin Institute of Technology (China) )
  • Lu,C. ( Harbin Institute of Technology (China) )
  • Zhu,H. ( Wuhu Institute of Electric Vacuum Technique (China) )
  • Xu,J. ( China Academy of Space Technology )
Publication title:
Display devices and systems II : 16-17 September 1998, Beijing, China
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
3560
Pub. Year:
1998
Page(from):
217
Page(to):
220
Pub. info.:
Bellingham, Washington: SPIE-The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819430212 [0819430218]
Language:
English
Call no.:
P63600/3560
Type:
Conference Proceedings

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