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Electrical and structural properties of grain boundary in polycrystalline Si

Author(s):
  • Young, R.T. ( Solid State Divison, Oak Ridge National Laboratory )
  • Narayan, J. ( Solid State Divison, Oak Ridge National Laboratory )
  • Chang, Y.K. ( Solid State Divison, Oak Ridge National Laboratory )
Publication title:
Grain boundaries in semiconductors : proceedings of the Materials Research Society annual meeting, November 1981, Boston Park Plaza Hotel, Boston, Massachusetts, U.S.A.
Title of ser.:
Materials Research Society symposia proceedings
Ser. no.:
5
Pub. Year:
1982
Page(from):
111
Page(to):
117
Pub. info.:
New York: North-Holland
ISSN:
02729172
ISBN:
9780444006974 [0444006974]
Language:
English
Call no.:
M23500/5
Type:
Conference Proceedings

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