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High resolution electron microscopy of grain boundaries in silicon

Author(s):
  • Cunningham, B. ( Materials Science and Engineering, Cornell University )
  • Ast, D. ( Materials Science and Engineering, Cornell University )
Publication title:
Grain boundaries in semiconductors : proceedings of the Materials Research Society annual meeting, November 1981, Boston Park Plaza Hotel, Boston, Massachusetts, U.S.A.
Title of ser.:
Materials Research Society symposia proceedings
Ser. no.:
5
Pub. Year:
1982
Page(from):
21
Page(to):
26
Pub. info.:
New York: North-Holland
ISSN:
02729172
ISBN:
9780444006974 [0444006974]
Language:
English
Call no.:
M23500/5
Type:
Conference Proceedings

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