Denyer P. S., Davies C. M., Evans-Hurrell A. J., Williams P., Finch G. R.
Kluwer Academic Publishers
|
Weber, S., Limmer, W., Thonke, K., Sauer, R., Baier, T., Geiger, D., Meyer, H., Panzlaff, K.
MRS - Materials Research Society
|
Brookes R. J., Johnson O. M., Thomas S. J.
Springer-Verlag Berlin Heidelberg New York Tokyo
|
T.J. Cunningham, R.C. Gee, E.R. Fossum, S.M. Baier
Electrochemical Society
|
Xie, S., Herrick, R.W., Brabander, G.N.D., Widjaja, W.H., Koelle, U., Cheng, A.-N., Giovane, L.M., Hu, F.Z., Keever, …
SPIE-The International Society for Optical Engineering
|
Li, X., Jones, A. M., Roh, S. D., Turnbull, D. A., Reuter, E. E., Gu, S. Q., Bishop, S. G., Coleman, J. J.
MRS - Materials Research Society
|
Fenves J. S., Flemming U., Hendrickson T. C., Maher L. M., Schmitt G.
Kluwer Academic Publishers
|
Kwon H. S, Kim Y. J, Lim M. T
SPIE - The International Society of Optical Engineering
|
Polyakov, V. I., Rukovishnikov, A. I., Khomich, A. V., Druz, B. L., Kania, D., Hayes, A., Prelas, M. A., Tompson, R. V., …
MRS - Materials Research Society
|
Heffelfinger, J. R., Bench, M. W., Carter, C. B.
MRS - Materials Research Society
|
Puppels,G.J., van Aken,T., Wolthuis,R., Caspers,P.J., Bakker Schut,T.C., Bruining,H.A., Romer,T.J., Buschman,H.P.J., …
SPIE-The International Society for Optical Engineering
|
Lechna-Marczynska,M.I., Licznerski,T.J., Kasprzak,H.T.
SPIE - The International Society for Optical Engineering
|