de Vries J. J., von Hoyer M.
D. Reidel
|
Athavale N. R., Rangarajan R.
D. Reidel
|
Edmunds M. W., Darling G. W., Kinniburgh G. D.
D. Reidel
|
de Bruin R. A. H.
D. Reidel
|
|
Gieske, A.S., Wubett, M.T., Timmermans, W.J., Parodi, G.N., Wolski, P., Arneth, A.
SPIE - The International Society of Optical Engineering
|
Chandrasekharan H., Navada V. S., Jain K. S., Rao M. S., Singh P. Y.
D. Reidel
|
M. W. Lubczynski
Springer
|
Timmermans, W.J., Gieske, A.S., Kustas, W.P., Wolski, P., Arneth, A., Parodi, G.N.
SPIE - The International Society of Optical Engineering
|
Basmaci Y., Al-Kabir M.
D. Reidel
|
Muralidharan H., Athavale N. R., Murti S. C.
D. Reidel
|
Troch, P.
ESA Publications Division
|