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Intensity oscillations in reflection high energy electron diffraction during epitaxial growth

Author(s):
Publication title:
Surface and interface characterization by electron optical methods
Title of ser.:
NATO ASI series. Series B, Physics
Ser. no.:
191
Pub. Year:
1988
Page(from):
185
Page(to):
193
Pages:
9
Pub. info.:
New York: Plenum Press
ISBN:
9780306430862 [030643086X]
Language:
English
Call no.:
N11479/191
Type:
Conference Proceedings

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