Board Level Reliability of Chip Scale Packages
- Author(s):
- Hung,Sung-Ching ( Advanced Semiconductor Engineering Inc. )
- Zheng,P.J.
- Chen,H.N.
- Lee,S.C.
- Lee,J.J.
- Publication title:
- Proceedings : 1999 International Symposium on Microelectronics : 26-28 October 1999, Chicago, Illinois
- Title of ser.:
- Proceedings of SPIE - the International Society for Optical Engineering
- Ser. no.:
- 3906
- Pub. Year:
- 1999
- Page(from):
- 571
- Page(to):
- 580
- Pub. info.:
- Bellingham, Wash.: SPIE - The International Society for Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780930815585 [0930815580]
- Language:
- English
- Call no.:
- P63600/3906
- Type:
- Conference Proceedings
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