Progress toward developing high-performance 193-nm single-layer positive resist based on functionalized poly(norbornenes)
- Author(s):
Varanasi,P.R. ( IBM Microelectronics Div. ) Jordhamo,G.M. Lawson,M.C. Chen,K.-J. Brunsvold,W.R. Hughes,T. Keller,R. Khojasteh,M. Li,W. Allen,R.D. Ito,H. Opitz,J. Truong,H.D. Wallow,T.I. - Publication title:
- Advances in resist technology and processing XVII : 28 February - 1 March 2000, Santa Clara, USA
- Title of ser.:
- Proceedings of SPIE - the International Society for Optical Engineering
- Ser. no.:
- 3999
- Pub. Year:
- 2000
- Vol.:
- Part2
- Page(from):
- 1157
- Page(to):
- 1162
- Pub. info.:
- Bellingham, Wash.: SPIE - The International Society for Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819436177 [0819436178]
- Language:
- English
- Call no.:
- P63600/3999
- Type:
- Conference Proceedings
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