Recent advances in a molecular level lithography simulation
- Author(s):
Schmid,G.M. ( Univ.of Texas at Austin ) Singh,V.K. Flanagin,L.W. Stewart,M.D. Burns,S.D. Willson,C.G. - Publication title:
- Advances in resist technology and processing XVII : 28 February - 1 March 2000, Santa Clara, USA
- Title of ser.:
- Proceedings of SPIE - the International Society for Optical Engineering
- Ser. no.:
- 3999
- Pub. Year:
- 2000
- Vol.:
- Part2
- Page(from):
- 675
- Page(to):
- 685
- Pub. info.:
- Bellingham, Wash.: SPIE - The International Society for Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819436177 [0819436178]
- Language:
- English
- Call no.:
- P63600/3999
- Type:
- Conference Proceedings
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