Study of Electrical Transport Across Interfaces Between Wide-Gap Semiconductor and Metal Oxides | 東京工業大学附属図書館文献データベース

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Study of Electrical Transport Across Interfaces Between Wide-Gap Semiconductor and Metal Oxides

Author(s):

Publication title:

Epitaxial oxide thin films III : symposium held March 31-April 2, 1997, San Francisco, California, U.S.A.

Title of ser.:

Materials Research Society symposium proceedings

Ser. no.:

474

Pub. Year:

1997

Page(from):

119

Pub. info.:

Pittsburgh, Pa.: MRS - Materials Research Society

ISSN:

02729172

ISBN:

9781558993785 [1558993789]

Language:

English

Call no.:

M23500/474

Type:

Conference Proceedings

Details

TDL ID:	ZA00018913
Series ID:	PA00000011
Conf. info. (Name):	Epitaxial oxide thin films
Conf. info. (Number):	3rd
Conf. info. (Venue):	San Francisco, California, U.S.A.
Conf. info. (Date):	1997.03.31-1997.04.02

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