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LATERAL VARIATION IN THE SCHOTTKY BARRIER HEIGHT AND OBSERVATION OF CRITICAL LENGTHS AT Au/PtSi/(100)Si AND Au/(100)GaAs DIODES

Author(s):
Talin, A. Alec
Ngo, Tue
Williams, R. Stanley
Morgan, Brent A.
Ring, Ken M.
Kavanagh, Karen L.
1 more
Publication title:
Advanced metallization for devices and circuits--science, technology, and manufacturability : symposium held April 4-8, 1994, San Francisco, California, U.S.A.
Title of ser.:
Materials Research Society symposium proceedings
Ser. no.:
337
Pub. Year:
1994
Page(from):
319
Pub. info.:
Pittsburgh, Pa.: MRS - Materials Research Society
ISSN:
02729172
ISBN:
9781558992375 [1558992375]
Language:
English
Call no.:
M23500/337
Type:
Conference Proceedings

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