Blank Cover Image

Image acquisition and calibration methods in quantitative confocal laser scanning microscopy

Author(s):
Bradl,J. ( Ruprecht-Karls-Univ.Heidelberg )
Rinke,B.
Esa,A.
Edelmann,P.
Krieger,H.
Schneider,B.
Hausmann,M.
Cremer,C.
3 more
Publication title:
Proceedings of optical biopsies and microscopic techniques : 7-9 September 1996, Vienna, Austria
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
2926
Pub. Year:
1996
Vol.:
Part2
Page(from):
201
Page(to):
206
Pub. info.:
Bellingham, Wash., USA: SPIE-The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819423283 [0819423289]
Language:
English
Call no.:
P63600/2926
Type:
Conference Proceedings

Similar Items:

Rinke,B., Bradl,J., Edelmann,P., Schneider,B., Hausmann,M., Cremer,C.

SPIE-The International Society for Optical Engineering

Birk, H., Engelhardt, J., Storz, R., Hartmann, N., Bradl, J., Ulrich, H.

SPIE-The International Society for Optical Engineering

Bradl,J., Rinke,B., Schneider,B., Hausmann,M., Cremer,C.

SPIE-The International Society for Optical Engineering

Rauch,J., Hausmann,M., Solovei,I., Horsthemke,B., Cremer,T., Cremer,C.

SPIE-The International Society for Optical Engineering

Hausmann,M., Schneider,B., Bradl,J., Cremer,C.

SPIE-The International Society for Optical Engineering

Davis, B.J., Karl, W.C., Goldberg, B.B., Swan, A.K., Unlu, M.S.

SPIE - The International Society of Optical Engineering

Edelmann,P., Cremer,C.

SPIE - The International Society for Optical Engineering

Zerbe,J., Cotze,C.H., Zuschratter,W.

SPIE - The International Society for Optical Engineering

Papastavrou,G., Rinke,B., Hausmann,M., Cremer,C.

SPIE-The International Society for Optical Engineering

Kempen,G.M.P.van, Vliet,L.J.van, Verveer,P.J.

SPIE-The International Society for Optical Engineering

Edelmann,P., Esa,A., Bornfleth,H., Heintzmann,R., Hausmann,M., Cremer,C.

SPIE - The International Society for Optical Engineering

Lenderink, E., Lucassen, G.W., van Kemenade, P.M., Steenwinkel, M.-J.S.T., Vink, A.A.

SPIE-The International Society for Optical Engineering

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12