Blank Cover Image

Infrared standards for system calibration

Author(s):
Clarke,F.J.J. ( National Physical Lab. )  
Publication title:
Specification, Production, and Testing of Optical Components and Systems
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
2775
Pub. Year:
1996
Vol.:
Part1
Page(from):
6
Page(to):
17
Pub. info.:
Bellingham, Wash.: SPIE-The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819421609 [081942160X]
Language:
English
Call no.:
P63600/2775
Type:
Conference Proceedings

Similar Items:

1 Conference Proceedings Infrared regular reflectance standards from NPL

Clarke,F.J.J.

SPIE-The International Society for Optical Engineering
7 Conference Proceedings Asteroids as Calibration Standards in the Thermal Infrared - Applications and Results from ISO

Mueller, T.G., Lagerros, J.S.V.

ESA Publications Division
2 Conference Proceedings NPL-NRC comparison of mid-infrared regular transmittance

Chunnilall, C.J., Clarke, F.J.J., Rowell, N.L.

SPIE-The International Society for Optical Engineering
8 Conference Proceedings Naturalness and image quality: chroma and hue variation in color images of natural scenes

H. de Ridder, F.J.J. Blommaert, E.A. Fedorovskaya

Society of Photo-optical Instrumentation Engineers
3 Conference Proceedings Diffuse reflectance scales at NPL

Chunnilall, C.J., Clarke, F.J.J., Shaw, M.J.

SPIE-The International Society for Optical Engineering
9 Conference Proceedings Recent progress at NPL in the development of mid-infrared spectrometric measurements

Clarke, F. J. J., Chunnilall, C. J., Rogers, L. J.

SPIE-The International Society for Optical Engineering
4 Conference Proceedings Interfacial Microchemistry

van Loo, F.J.J., Kodentsov, A.A.

Electrochemical Society
10 Conference Proceedings Nondestructive characterization technique for most n-type semiconductors, including infrared detector materials

F.W. Clarke

Society of Photo-optical Instrumentation Engineers
5 Conference Proceedings Metallization of SiC Ceramics: Chemical Aspects

Kodentsov, A.A., van Loo, F.J.J.

Electrochemical Society
11 Conference Proceedings Optical characterization technique for n-type semiconductors including infrared detector and other optical materials

Clarke,F.W.

SPIE-The International Society for Optical Engineering
6 Conference Proceedings THE USE OF PHASE DIAGRAMS FOR THE STUDY OF METAL-CERAMIC INTERDIFFUSION

Metselaar,R., VanLoo,F.J.J.

Trans Tech Publications
12 Conference Proceedings Latest measurement techniques at NPL for the characterization of infrared detectors and materials

Theocharous, E., Clarke, F. J. J., Rogers, L. J., Fox, N. P.

SPIE - The International Society of Optical Engineering
1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12