410K pixel PtSi Schottky-barrier infrared CCD image sensor
- Author(s):
- Shoda,M. ( Nikon Corp. )
- Akagawa,K.
- Kazama,T.
- Publication title:
- Infrared technology and applications XXII : 8-12 April 1996, Orlando, Florida
- Title of ser.:
- Proceedings of SPIE - the International Society for Optical Engineering
- Ser. no.:
- 2744
- Pub. Year:
- 1996
- Page(from):
- 23
- Page(to):
- 32
- Pub. info.:
- Bellingham, Wash., USA: SPIE-The International Society for Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819421258 [0819421251]
- Language:
- English
- Call no.:
- P63600/2744
- Type:
- Conference Proceedings
Similar Items:
1
Conference Proceedings
Estimating temperature and emissivity for infrared measurements using a PtSi Schottky-barrier infrared CCD image sensor
Society of Photo-optical Instrumentation Engineers |
7
Conference Proceedings
Construction and performance of an 811 x 508 - element multi-wavelength PtSi IRCCD imager
SPIE |
SPIE-The International Society for Optical Engineering |
8
Conference Proceedings
Infrared imaging spectrometry by the use of bundled chalcogenide glass fibers and a PtSi CCD camera
SPIE - The International Society for Optical Engineering |
Society of Photo-optical Instrumentation Engineers |
9
Conference Proceedings
High Performance P-Channel Schottky Barrier Thin-Film Transistors with PtSi Source/Drain
Electrochemical Society |
SPIE-The International Society for Optical Engineering |
Society of Photo-optical Instrumentation Engineers |
SPIE-The International Society for Optical Engineering |
SPIE-The International Society for Optical Engineering |
SPIE-The International Society for Optical Engineering |
12
Conference Proceedings
Thermal sensing and imaging of the dry-sliding contact surface using IR thermomicroscope
Society of Photo-optical Instrumentation Engineers |