H. Zwick, J.A. Zuclich, B.E. Stuck, D.A. Gagliano, D.J. Lund
Society of Photo-optical Instrumentation Engineers
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Scales,D.K., Schuschereba,S.T., Lund,D.J., Stuck,B.E.
SPIE-The International Society for Optical Engineering
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H. Zwick, D.A. Gagliano, J.A. Zuclich, B.E. Stuck, M. Belkin
Society of Photo-optical Instrumentation Engineers
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Schuschereba,S.T., Scales,D.K.
SPIE-The International Society for Optical Engineering
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Zwick,H., Lund,D.J., Elliott,R., Schuschereba,S.T., Edsall,P.R.
SPIE-The International Society for Optical Engineering
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Brown, J., Allen, R.D., Zwick, H., Schuschereba, S.T., Lund, D.J., Stuck, B.E.
SPIE-The International Society for Optical Engineering
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H. Zwick, D.J. Lund, R. Elliot, S.T. Schuschereba
Society of Photo-optical Instrumentation Engineers
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Schuschereba,S.T., Cross,M.E., Scales,D.K., Pizarro,J.M., Edsall,P.R., Stuck,B.E., Marshall,J.
SPIE - The International Society for Optical Engineering
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Zwick,H., Elliot,R., Schuschereba,S.T., Lund,D.J., Stuck,B.E.
SPIE-The International Society for Optical Engineering
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Scales,D.K., Zwick,H., Lund,D.J., Belkin,M., Loveday,J.
SPIE-The International Society for Optical Engineering
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Zuclich,J.A., Schuschereba,S.T., Zwick,H., Cheney,F., Stuck,B.E.
SPIE-The International Society for Optical Engineering
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R. G. Aranibar, N. J. Kemp, J. C. Dwelle, S. E. Byers, M. K. Markey, T. E. Milner, H. G. Rylander
SPIE - The International Society of Optical Engineering
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