Chen, P. J., Truong, C. M., Corneille, J. S., Oh, W. S., Goodman, D. W.
MRS - Materials Research Society
|
Zeuthen, P., Bartholdy, J., Wiwel, P., Cooper, B. H.
Elsevier
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Jesse D. Benck, Zhebo Chen, Leah Y. Kuritzky, Arnold J. Forman, Thomas F. Jaramillo
American Institute of Chemical Engineers
|
Terorde, R. J. A. M., Jong, M. C. de, Crombag, M. J. D., Brink, P. J. van den, Dillen, A. J. van, Geus, J. W.
Elsevier
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Jesse D. Benck, Zhebo Chen, Leah Y. Kuritzky, Arnold J. Forman, Thomas F. Jaramillo
American Institute of Chemical Engineers
|
Janssens, J.P., Langeveld, A.D. van, Bonne, R.L.C., Lok, C.M., Moulijn, J.A.
American Institute of Chemical Engineers
|
Peden, C. H. F., Goodman, D. W.
American Chemical Society
|
Auret, F.D., Meyer, W.E., Laarhoven, H.A. van, Goodman, S.A., Legodi, M.J., Beaumont, B., Gibart, P.
Materials Research Society
|
Leon, S. Giraldo de (Colombia), Grange, P. (Belgium), Delmon, B. (Belgium)
Elsevier
|
W. R. Johnson, S. J. Hook, P. Z. Mouroulis, D. W. Wilson, S. D. Gunapala
Society of Photo-optical Instrumentation Engineers
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Brink, P. J. van den, Terorde, R. J. A. M., Moors, J. H., Dillen, A. J. van, Geus, J. W.
Elsevier
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J.A. Satrio, B.H. Shanks, T.D. Wheelock
American Institute of Chemical Engineers
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