Stein, B., Weimer, C., Gaube, J.
Elsevier
|
Mason, D. P., Aken, Van D. C., Webber, J. G
Materials Research Society
|
Criss, D. L., Fisher, T. H., Ingram, L. L., Jr., Beard, D. J., Schultz, Tor P.
American Chemical Society
|
Park,N.J., Wang,C.Q., Bunge,H.J.
Trans Tech Publications
|
Aubert C., Begue -P. J., Bonnet-Delphon D., Mesureur D.
Kluwer Academic Publishers
|
Joullie, A., Christol, P., Rodriguez, J. B., Ait-Kaci, H., Chevrier, F., Nieto, J., Anda, F. De
SPIE - The International Society of Optical Engineering
|
C.-M. Chiang, H. Kung
Elsevier
|
Buerger, K., Schaefer, H.J.
Electrochemical Society
|
Claus, P., Kraak, P., Schodel, R.
Elsevier
|
Beziat, J. C., Besson, M., Gallezot, P., Juif, S., Durecu, S.
Elsevier
|
J.H. Kim, J.T. Yeom, N.K. Park, C.S. Lee
Trans Tech Publications
|
Besson, M., Beziat, J. -C., Blanc, B., Durecu, S., Gallezot, P.
Elsevier
|