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Formation of Oxygen Dimers in Silicon during Electron-Irradiation Above 250 °C

Author(s):
Lindstrom,J.L.
Hallberg,T.
Aberg,D.
Svensson,B.G.
Murin,L.I.
Markevich,V.P.
1 more
Publication title:
Defects in semiconductors, icds-19 : proceedings of the 19th International Conference on Defects in Semiconductors, Aveiro, Portugal, July 1997
Title of ser.:
Materials science forum
Ser. no.:
258-263
Pub. Year:
1997
Vol.:
Part1
Page(from):
367
Page(to):
372
Pub. info.:
Zurich, Switzerland: Trans Tech Publications
ISSN:
02555476
ISBN:
9780878497874 [0878497870]
Language:
English
Call no.:
M23650
Type:
Conference Proceedings

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