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EPR and ENDOR of Defects in Silicon Carbide

Author(s):
Spaeth,J.-M.
Greulich-Weber,S.
Marz,M.
Reinke,J.
Feege,M.
Kalbukhova,E.N.
Lukin,S.N.
2 more
Publication title:
Proceedings of the 13th International Conference on Defects in Insulating Materials, ICDIM 96, July 15-19, 1996, Wake Forest University, Winston-Salem, NC 27109, USA
Title of ser.:
Materials science forum
Ser. no.:
239-241
Pub. date:
1997
Page(from):
149
Page(to):
154
Pub. info.:
Zurich, Switzerland: Trans Tech Publications
ISSN:
02555476
ISBN:
9780878497560 [0878497560]
Language:
English
Call no.:
M23650
Type:
Conference Proceedings

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