Blank Cover Image

GUFI-WYRIET:An integrated PC powder pattern analysis package

Author(s):
Publication title:
EPDIC 1 : proceedings of the First European Powder Diffraction Conference held, March 14th - 16th, 1991. in Munich, Germany
Title of ser.:
Materials science forum
Ser. no.:
79-82
Pub. Year:
1991
Vol.:
Pt.1
Page(from):
277
Page(to):
282
Pub. info.:
Aedermannsdorf, Switzerland: Trans Tech Publications
ISSN:
02555476
ISBN:
9780878496341 [0878496343]
Language:
English
Call no.:
M23650
Type:
Conference Proceedings

Similar Items:

Cole,B.E., Higashi,R.E., Ridley,J.A., Wood,R.A.

SPIE-The International Society for Optical Engineering

P. Rajiv, R.E. Dinnebier, M. Jansen

Trans Tech Publications

Walraven, J.A., Cole, E.l., Barr, Jr.D.L., Anderson, R.E., Kilgo, A., Maciel, J.J., Morrison, R., Karabudak, N.N.

SPIE - The International Society of Optical Engineering

Dinnebier, R. E.

Trans Tech Publications

A. Samy, R.E. Dinnebier, P.E. Kazin, S. van Smaalen, M. Jansen

Trans Tech Publications

Meinhardt,Mike, Schneider,H., Flannery,J., Krieger,Th.

SPIE - The International Society for Optical Engineering, IMAPS

Tovar,M., Dinnebier,R.E., Eysel,W.

Trans Tech Publications

Estevez-Rams, E., Lora, R., Penton, A., Aragon-Fernandez, B., Fuess, H.

Trans Tech Publications

M. Müller, R.E. Dinnebier, N.Z. Ali, B.J. Campbell, M. Jansen

Trans Tech Publications

Roisnel, T., Rodriquez-Carvajal, J.

Trans Tech Publications

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12