X-ray diffraction line profiles due to real polycrystals

X-ray diffraction line profiles due to real polycrystals

Author(s):: Klimanek,P.
Publication title:: EPDIC 1 : proceedings of the First European Powder Diffraction Conference held, March 14th - 16th, 1991. in Munich, Germany
Title of ser.:: Materials science forum
Ser. no.:: 79-82
Pub. Year:: 1991
Vol.:: Pt.1
Page(from):: 73
Page(to):: 84
Pub. info.:: Aedermannsdorf, Switzerland: Trans Tech Publications
ISSN:: 02555476
ISBN:: 9780878496341 [0878496343]
Language:: English
Call no.:: M23650
Type:: Conference Proceedings

Details

TDL ID:	ZA00018820
Series ID:	PA00000012
Conf. info. (Name):	European Powder Diffraction Conference : EPDIC 1
Conf. info. (Number):	1st
Conf. info. (Venue):	Munich, Germany
Conf. info. (Date):	1991.03.14-1991.03.16

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