Synchrotron measurements of the absolute X-ray quantum efficiency of CsI-coated microchannel plates

Synchrotron measurements of the absolute X-ray quantum efficiency of CsI-coated microchannel plates

Author(s):

Rideout, R.M. ( University of Leicester, UK )

Publication title:

EUV, x-ray, and gamma-ray instrumentation for astronomy IX : 22-24 July 1998 San Diego, California

Title of ser.:

Proceedings of SPIE - the International Society for Optical Engineering

Ser. no.:

3445

Pub. Year:

1998

Page(from):

384

Page(to):

392

Pub. info.:

Bellingham, Wash.: SPIE

ISSN:

0277786X

ISBN:

9780819429001 [0819429007]

Language:

English

Call no.:

P63600/3445

Type:

Conference Proceedings

Details

TDL ID:	ZA00018807
Series ID:	PA00000029
Conf. info. (Name):	Optics & Photonics : EUV, X-Ray, and Gamma-Ray Instrumentation for Astronomy
Conf. info. (Number):	1998 : 9th
Conf. info. (Venue):	San Diego, CA, USA
Conf. info. (Date):	1998.07.22-1998.07.24

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