Automated segmentation and feature extraction of product inspection items

Automated segmentation and feature extraction of product inspection items

Author(s):

Talukder,A. ( Carnegie Mellon Univ. )
Casasent,D.P. ( Carnegie Mellon Univ. )

Publication title:

Optical pattern recognition VIII : 22-23 April, 1997, Orlando, Florida

Title of ser.:

Proceedings of SPIE - the International Society for Optical Engineering

Ser. no.:

3073

Pub. Year:

1997

Page(from):

96

Page(to):

107

Pub. info.:

Bellingham, Wash.: SPIE-The International Society for Optical Engineering

ISSN:

0277786X

ISBN:

9780819424884 [0819424889]

Language:

English

Call no.:

P63600/3073

Type:

Conference Proceedings

Details

TDL ID:	ZA00018802
Series ID:	PA00000029
Conf. info. (Name):	Defense, Security, and Sensing : Optical Pattern Recognition
Conf. info. (Number):	1997 : 8th
Conf. info. (Venue):	Orlando, FL, USA
Conf. info. (Date):	1997.04.22-1997.04.23

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