Recursive estimation of fast impedance changes in electrical impedance tomography and a related problem

Recursive estimation of fast impedance changes in electrical impedance tomography and a related problem

Author(s):

Kaipio,J.P. ( Univ.of Kuopio (Finland) )
Somersalo,E. ( Helsinki Univ.of Technology (Finland) )
Karjalainen,P.A. ( Univ.of Kuopio (Finland) )
Vauhkonen,M.J. ( Univ.of Kuopio (Finland) )

Publication title:

Computational, experimental, and numerical methods for solving ill-posed inverse imaging problems : medical and nonmedical applications : 30-31 July 1997, San Diego, California

Title of ser.:

Proceedings of SPIE - the International Society for Optical Engineering

Ser. no.:

3171

Pub. Year:

1997

Page(from):

208

Page(to):

216

Pub. info.:

Bellingham, Wash., USA: SPIE-The International Society for Optical Engineering

ISSN:

0277786X

ISBN:

9780819425935 [0819425931]

Language:

English

Call no.:

P63600/3171

Type:

Conference Proceedings

Details

TDL ID:	ZA00018793
Series ID:	PA00000029
Conf. info. (Name):	Optics & Photonics : Computational, experimental, and numerical methods for solving ill-posed inverse imaging problems
Conf. info. (Number):	1997
Conf. info. (Venue):	San Diego, CA, USA
Conf. info. (Date):	1997.07.30-1997.07.31

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