Direct measurements of transient structures by means of time-resolved x-ray diffraction

Direct measurements of transient structures by means of time-resolved x-ray diffraction

Author(s):

Chen,P. ( Univ.of California/Irvine )
Tomov,I.V. ( Univ.of California/Irvine )
Rentzepis,P.M. ( Univ.of California/Irvine )

Publication title:

Laser techniques for condensed-phase and biological systems : 29-31 January 1998, San Jose, California

Title of ser.:

Proceedings of SPIE - the International Society for Optical Engineering

Ser. no.:

3273

Pub. Year:

1998

Page(from):

226

Page(to):

234

Pub. info.:

Bellingham, Wash., USA: SPIE-The International Society for Optical Engineering

ISSN:

0277786X

ISBN:

9780819427120 [0819427128]

Language:

English

Call no.:

P63600/3273

Type:

Conference Proceedings

Details

TDL ID:	ZA00018783
Series ID:	PA00000029
Conf. info. (Name):	Photonics West : Laser Techniques for Condensed-Phase and Biological Systems
Conf. info. (Number):	1998
Conf. info. (Venue):	San Jose, CA, USA
Conf. info. (Date):	1998.01.29-1998.01.31

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