Nanometer-level metrology with a low-voltage CD SEM
- Author(s):
Yoshimura,T. ( Hitachi Central Research Lab. (Japan) ) Ezumi,M. ( Hitachi,Ltd. (Japan) ) Otaka,T. ( Hitachi,Ltd. (Japan) ) Todokoro,H. ( Hitachi,Ltd. (Japan) ) Yamamoto,J. ( Hitachi Central Research Lab. (Japan) ) Terasawa,T. ( Hitachi Central Research Lab. (Japan) ) - Publication title:
- Metrology, inspection, and process control for microlithography XII : 23-25 February 1998, San Clara, California
- Title of ser.:
- Proceedings of SPIE - the International Society for Optical Engineering
- Ser. no.:
- 3332
- Pub. Year:
- 1998
- Page(from):
- 61
- Page(to):
- 70
- Pub. info.:
- Bellingham, Wash., USA: SPIE-The International Society for Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819427779 [0819427772]
- Language:
- English
- Call no.:
- P63600/3332
- Type:
- Conference Proceedings
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