Blank Cover Image

Classification of product inspection items using nonlinear features

Author(s):
Publication title:
Optical Pattern Recognition IX
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
3386
Pub. Year:
1998
Page(from):
159
Page(to):
170
Pub. info.:
Bellingham, Wash.: SPIE-The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819428356 [0819428353]
Language:
English
Call no.:
P63600/3386
Type:
Conference Proceedings

Similar Items:

Talukder,A., Casasent,D.P.

SPIE - The International Society for Optical Engineering

Casasent,D.P., Talukder,A.

SPIE-The International Society for Optical Engineering

Casasent,D.P., Talukder,A., Lee,H.-W.

SPIE-The International Society for Optical Engineering

Talukder,A., Casasent,D.P., Lee,H.-W., Keagy,P.M., Schatzki,T.F.

SPIE - The International Society for Optical Engineering

Talukder,A., Casasent,D.P.

SPIE-The International Society for Optical Engineering

Talukder,A., Casasent,D.P., Lee,H.-W., Keagy,P.M., Schatzki,T.F.

SPIE - The International Society for Optical Engineering

Talukder,A., Casasent,D.P.

SPIE-The International Society for Optical Engineering

Talukder,A., Casasent,D.P.

SPIE-The International Society for Optical Engineering

Casasent,D.P., Talukder,A., Cox,W., Chang,H.-T., Weber,D.

SPIE-The International Society for Optical Engineering

Talukder, Ashit, Casasent, David

SPIE

Casasent,D.P., Talukder,A.

SPIE - The International Society for Optical Engineering

Casasent,D.P., Chen,L., Talukder,A.

SPIE-The International Society for Optical Engineering

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12