Characterization of ion-implanted Si rapidly annealed with incoherent light
- Author(s):
Benton, J.L. ( Bell Laboratories ) Celler, G.K. ( Bell Laboratories ) Jacobson, D.C. ( Bell Laboratories ) Kimerling, L.C. ( Bell Laboratories ) Lischner, D.J. ( Bell Laboratories ) Miller, G.L. ( Bell Laboratories ) Robinson, Mc.D. ( Bell Laboratories ) - Publication title:
- Laser and electron-beam interactions with solids : proceedings of the Materials Research Society Annual Meeting, November 1981, Boston Park Plaza Hotel, Boston, Massachusetts, U.S.A.
- Title of ser.:
- Materials Research Society symposia proceedings
- Ser. no.:
- 4
- Pub. Year:
- 1982
- Page(from):
- 765
- Page(to):
- 770
- Pub. info.:
- New York: North Holland
- ISSN:
- 02729172
- ISBN:
- 9780444006936 [0444006931]
- Language:
- English
- Call no.:
- M23500/4
- Type:
- Conference Proceedings
Similar Items:
North Holland |
North-Holland |
North Holland |
Trans Tech Publications |
3
Conference Proceedings
FACETED MELTING AND SUPERHEATING OF CRYSTALLINE Si IRRADIATED WITH INCOHERENT LIGHT
North-Holland |
Materials Research Society |
Trans Tech Publications |
Materials Research Society |
Electrochemical Society |
11
Conference Proceedings
EVALUATION OF PHYSICAL AND ELECTRICAL PROPERTIES OF MOLYBDENUM IN SILICON FOR IC PROCESSING
Electrochemical Society |
6
Conference Proceedings
Ultra-Shallow Junction Formation Using Ion Implantation and Rapid Thermal Annealing: Physical and Practical Limits
Electrochemical Society |
Electrochemical Society |