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Total dose effects on CMOS active pixel sensors

Author(s):
Publication title:
Sensors and camera systems for scientific, industrial, and digital photography applications : 24-26 January 2000, San Jose, USA
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
3965
Pub. Year:
2000
Page(from):
157
Page(to):
167
Pub. info.:
Bellingham, Wash.: SPIE - The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819435835 [081943583X]
Language:
English
Call no.:
P63600/3965
Type:
Conference Proceedings

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