Photon-counting intensified random-access charge injection device
- Author(s):
Norton,T.J. ( NASA Coddard Space FIight Ctr. ) Morrissey,P.F. Haas,P. Payne,L.J. Carbone,J. Kimble,R.A. - Publication title:
- Ultraviolet and x-ray detection, spectroscopy and polarimetry III : 19-20 July 1999, Denver, Colorado
- Title of ser.:
- Proceedings of SPIE - the International Society for Optical Engineering
- Ser. no.:
- 3764
- Pub. Year:
- 1999
- Page(from):
- 234
- Page(to):
- 245
- Pub. info.:
- Bellingham, Wash.: SPIE - The International Society for Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819432506 [0819432504]
- Language:
- English
- Call no.:
- P63600/3764
- Type:
- Conference Proceedings
Similar Items:
Society of Photo-optical Instrumentation Engineers |
SPIE-The International Society for Optical Engineering |
SPIE-The International Society for Optical Engineering |
8
Conference Proceedings
Comparison of electrical CD measurements and cross-section lattice-plane counts of submicrometer features replicated in(100)silicon-on-insulator material
SPIE - The International Society for Optical Engineering |
3
Conference Proceedings
A high-speed event-driven active pixel sensor readout for photon-counting microchannel plate detectors
SPIE-The International Society for Optical Engineering |
SPIE-The International Society for Optical Engineering |
SPIE-The International Society for Optical Engineering |
SPIE-The International Society for Optical Engineering |
SPIE-The International Society for Optical Engineering |
SPIE - The International Society of Optical Engineering |
SPIE-The International Society for Optical Engineering |
12
Conference Proceedings
Digital demodulation algorithm for the interferometric characterization of RF MEMS structures
SPIE - The International Society of Optical Engineering |