In-process layer surface inspection of SLA products

In-process layer surface inspection of SLA products

Author(s):

Park,W.S. ( Korea Advanced Institute of Science and Technology )
Kim,M.Y.
Lee,H.G.
Cho,H.S.
Leu,M.C.

Publication title:

Intelligent systems in design and manufacturing

Title of ser.:

Proceedings of SPIE - the International Society for Optical Engineering

Ser. no.:

3517

Pub. Year:

1998

Page(from):

70

Page(to):

78

Pub. info.:

Bellingham, Wash., USA: SPIE - The International Society for Optical Engineering

ISSN:

0277786X

ISBN:

9780819429780 [0819429783]

Language:

English

Call no.:

P63600/3517

Type:

Conference Proceedings

Details

TDL ID:	ZA00018528
Series ID:	PA00000029
Conf. info. (Name):	Photonics East : Intelligent systems in design and manufacturing
Conf. info. (Number):	1998
Conf. info. (Venue):	Boston, MA, USA
Conf. info. (Date):	1998.11.02-1998.11.04

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