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Gallium K-edge EXAFS study of GaN:Mg films

Author(s):
Pan,Y.-C. ( National Chiao Tung Univ. )
Wang,S.-F.
Lee,W.-H.
Lin,W.-C.
Shu,C.-K.
Chiang,C.-I.
Lin,C.-W.
Chang,H.
Lee,J.-F.
Jang,L.-Y.
Lin,D.-S.
Lee,M.-C.
Chen,W.-H.
Chen,W.-K.
9 more
Publication title:
Optoelectronic Materials and Devices II
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
4078
Pub. date:
2000
Page(from):
535
Page(to):
543
Pub. info.:
Bellingham, Wash.: SPIE - The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819437174 [0819437174]
Language:
English
Call no.:
P63600/4078
Type:
Conference Proceedings

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