Detailed study of plane-plane cavity fundamental mode far-field structure

Detailed study of plane-plane cavity fundamental mode far-field structure

Author(s):: Anokhov,S.P. ( Institute of Applied Optics )
Publication title:: Optoelectronic metrology : 28-30 September 1998, Ĺańcut, Poland
Title of ser.:: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:: 4018
Pub. Year:: 1998
Page(from):: 111
Page(to):: 117
Pub. info.:: Bellingham, Wash., USA: SPIE - The International Society for Optical Engineering
ISSN:: 0277786X
ISBN:: 9780819436443 [0819436445]
Language:: English
Call no.:: P63600/4018
Type:: Conference Proceedings

Details

TDL ID:	ZA00018516
Series ID:	PA00000029
Conf. info. (Name):	Optoelectronic metrology
Conf. info. (Number):	1998
Conf. info. (Venue):	Ĺańcut, Poland
Conf. info. (Date):	1998.09.28-1998.09.30

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