DETAILS OF THE DEFECT PROFILE IN SELF-ION IMPLANTED SILICON
- Author(s):
- Publication title:
- Materials synthesis and processing using ion beams : symposium held November 29-December 3, 1993, Boston, Massachusetts, U.S.A.
- Title of ser.:
- Materials Research Society symposium proceedings
- Ser. no.:
- 316
- Pub. Year:
- 1994
- Page(from):
- 87
- Pub. info.:
- Pittsburgh, Pa.: MRS - Materials Research Society
- ISSN:
- 02729172
- ISBN:
- 9781558992153 [1558992154]
- Language:
- English
- Call no.:
- M23500/316
- Type:
- Conference Proceedings
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