Blank Cover Image

Toward rf System-Level Integration: Process Integration Issues in SiGe BiCMOS

Author(s):
Freeman, G.
Schonenberg, K.
Ahlgren, D.
Jeng, S-J.
Nguyen-Ngoc, D.
Stein, K.
Colavito, D.
Subbanna, S.
Harame, D.
Meyerson, B.
5 more
Publication title:
Epitaxy and applications of si-based heterostructures : symposium held April 13-17, 1998, San Francisco, California, U.S.A.
Title of ser.:
Materials Research Society symposium proceedings
Ser. no.:
533
Pub. date:
1998
Page(from):
19
Pub. info.:
Warrendale, Pa.: MRS - Materials Research Society
ISSN:
02729172
ISBN:
9781558994393 [1558994394]
Language:
English
Call no.:
M23500/533
Type:
Conference Proceedings

Similar Items:

Harame, D., Subbanna, S., Dunn, J., St Onge, S.A., Freeman, G., Malinowski, J., Groves, R., Joseph, A., Ahlgren, D., …

Electrochemical Society

Bradford, G.D., Cressler, J.D., Harame, D.L.

Electrochemical Society

Subbanna, S., Ahlgren, D., Harame, D., Meyerson, B.S.

Electrochemical Society

Knoll, D., Heinemann, B., Ehwald, K.E., Rticker, H., Tillack, B., Osten, H.J.

Electrochemical Society

Schonenberg, K., Harame, D.L., Gilbert, M., Stanis, C., Gignac, L., Chan, S.

Electrochemical Society

Dunn, J., Joseph, A., Harame, D., Nowak, E.J., Meyerson, B.S.

Electrochemical Society

Schonenberg, K., Harame, D. L., Gilbert, M., Stanis, C., Gignac, L., Chan, S.

Electrochemical Society

Rocker, H., Heinemann, B., Barth, R., Knoll, D., Schmidt, D., Winkler, W.

Electrochemical Society

St Onge, S., Joseph, A., Lanzerotti, L., Feiichenfeld, N., Coolbaugh, D., Orner, B., Dunn, J., Harame, D.

Electrochemical Society

11 Conference Proceedings SiGe HETEROJUNCTION BIPOLAR TRANSISTORS

Arienzo, Maurizio, Comfort, James H., Crabbe, Emmanuel F., Harame, David L., Iyer, Subramanian S., Meyerson, Bernard S., …

Materials Research Society

6 Conference Proceedings THE MECHANISM OF OXIDATION OF SiGe

LeGoues, F. K., Rosenberg, R., Nguyen, T., Meyerson, B. S.

Materials Research Society

Vaed, K., Graham, W., Steen, M., Park, J.-E., Groves, R., Volant, R., Nunes, R., Vichiconti, J., Stein, K., Ahlgren, D.

SPIE - The International Society of Optical Engineering

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12