Blank Cover Image

The Effect of Ti Interlayer on the Hillock Formation of Al-0.5 wt%Cu Films on the TiN/Ti/SiO2/Si Multilayer Structure

Author(s):
Publication title:
Materials reliability in microelectronics VII : symposium held April 8-12, 1997, San Francisco, California, U.S.A.
Title of ser.:
Materials Research Society symposium proceedings
Ser. no.:
473
Pub. Year:
1997
Page(from):
421
Pub. info.:
Pittsburgh, Pa.: MRS - Materials Research Society
ISSN:
02729172
ISBN:
9781558993778 [1558993770]
Language:
English
Call no.:
M23500/473
Type:
Conference Proceedings

Similar Items:

Wang, L. P., Chuang, A., Lin, L. T., Huang, F. S., Perng, K., Hwang, J.

MRS - Materials Research Society

Huang, Amin, Zhang, Jian Xin, Wu, Xiao Wen, Wang, Yang

Trans Tech Publications

Gazda, J., Smith, P., White, R. A., Zhao, J.

Materials Research Society

Zhang, J. P., Hemment, P. L. F., Kubiak, R. A., Parker, E. H. C.

MRS - Materials Research Society

Doucet, L., Brun, A., Jaouen, H., Dupeux, M., Ignat, M.

MRS - Materials Research Society

DeHaven, P. W., Clevenger, L. A., Schnabe, R. F., Weber, S. J., Iggulden, R. C., Rodbell, K. P.

MRS - Materials Research Society

Kao, H-K., Cargill, G. S., III., Hwang, K. J., Ho, A. C., Wang, P-C., Hu, C-K.

MRS - Materials Research Society

Crespo, P., Marin, P., Agudo, P., Alocen, M.C., Hernando, A., Garcia-Escorial, A., Eckert, J., Roth, S., Schultz, L.

Trans Tech Publications

Ning, X. G., Guo, L. P., Huang, R. F., Gong, J., Yu, B. H., Wen, L. S., Ye, H. Q.

Materials Research Society

Cheng,S.D, Kam,C.H., Zhou,Y., Lam,Y.L., Chan,Y.C., Gan,W.S.

SPIE - The International Society for Optical Engineering

Alpay, S. P., Nagarajan, V., Bendersky, L. A., Vaudin, M. D., Aggarwal, S., Ramesh, R., Roytburd, A. L.

MRS - Materials Research Society

Naqvi, S.H.H., Vickers, M., Tarling, S., Barnes, P., Boyd, I.W.

Materials Research Society

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12