Microwave Separation Measurements of Bulk Lifetime and Surface Recombination Velocities in Si Wafers with Various Surface Properties

Microwave Separation Measurements of Bulk Lifetime and Surface Recombination Velocities in Si Wafers with Various Surface Properties

Author(s):

Publication title:

Microwave processing of materials V : symposium held April 8-12, 1996, San Francisco, California, U.S.A.

Title of ser.:

Materials Research Society symposium proceedings

Ser. no.:

430

Pub. Year:

1996

Page(from):

79

Pub. info.:

Pittsburgh,, PA: MRS - Materials Research Society

ISSN:

02729172

ISBN:

9781558993334 [1558993339]

Language:

English

Call no.:

M23500/430

Type:

Conference Proceedings

Details

TDL ID:	ZA00018449
Series ID:	PA00000011
Conf. info. (Name):	Symposium on microwave processing of materials
Conf. info. (Number):	5th
Conf. info. (Venue):	San Francisco, CA, USA
Conf. info. (Date):	1996.04.08-1996.04.12

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