Blank Cover Image

In Situ Investigation of the a-Si:H/c-Si Interface

Author(s):
Publication title:
Amorphous silicon technology, 1996 : symposium held April 8-12, 1996, San Francisco, California, U.S.A.
Title of ser.:
Materials Research Society symposium proceedings
Ser. no.:
420
Pub. Year:
1996
Page(from):
449
Pub. info.:
Pittsburgh, Pa.: MRS - Materials Research Society
ISSN:
02729172
ISBN:
9781558993235 [1558993231]
Language:
English
Call no.:
M23500/420
Type:
Conference Proceedings

Similar Items:

1 Conference Proceedings Characterization of Thin Semiconductor Films for (Opto)Electronic Applications

Elmiger, J. R., Feist, H., Kunst, M.

MRS - Materials Research Society
7 Conference Proceedings SURFACE PASSIVATION OF SINGLE CRYSTALLINE SILICON BY THIN AMORPHOUS SILICON LAYERS

Swiatkowski, C., Sanders, A., Neitzert, H.-C., Kunst, M.

MRS - Materials Research Society
2 Conference Proceedings Investigations of Silicon Nitride Films for Silicon Solar Cells

Elmiger, J. R., Kunst, M.

MRS - Materials Research Society
8 Conference Proceedings RECOMBINATION OF EXCESS CARRIERS AT HIGH EXCITATION DENSITY IN AMORPHOUS SILICON

Kunst, M., Haffer, C., Swiatkowski, C.

Materials Research Society
3 Conference Proceedings CHARGE CARRIER TRANSPORT IN c-Si/a-Si:H HETEROJUNCTIONS

Sanders, A., Neitzert, H.-C., Swiatkowski, C., Kunst, M.

Materials Research Society
9 Conference Proceedings Excess Charge Carrier Kinetics in Amorphous Silicon/Crystalline Silicon Heterojunctions

Aichberger, S. v., Hahneiser, O., Loffler, J., Feist, H., Kunst, M.

MRS - Materials Research Society
4 Conference Proceedings DEPOSITION TEMPERATURE AND OPTOELECTRONIC PROPERTIES OF a-Si:H FILMS

Swiatkowski, C., Hirsch, W., Kunst, M.

Materials Research Society
10 Conference Proceedings The Intuitive Thermalization Model Compared Explicit Multiple Trapping Calculations

Feist, H., Aichberger, S. v., Kunst, M.

MRS - Materials Research Society
5 Conference Proceedings OPTOELECTRONIC PROPERTIES OF a-Si:H FILMS DEPOSITED FROM He-DILUTED SILANE

Swiatkowski, C., Roca i Cabarrocas, P., Kunst, M.

Materials Research Society
11 Conference Proceedings OPTOELECTRONIC PROPERTIES OF a-SiC:H STUDIED BY TIME-RESOLVED MICROWAVE PHOTOCONDUCTIVITY AND PHOTOINDUCED ABSORPTION MEASUREMENTS

Swiatkowski, C., Herm, D., Hirsch, W., Kunst, M.

Materials Research Society
6 Conference Proceedings IN-SITU QUALITY CONTROL OF THE PRODUCTION OF SEMICONDUCTOR DEVICES BY MICROWAVE PHOTOCONDUCTIVITY MEASUREMENTS

Swiatkowski, C., Sanders, A., Kunst, M., Seidelmann, G., Haffer, C., Emmelmann, E.

Materials Research Society
12 Conference Proceedings THE DETERMINATION OF THE QUALITY OF a-Si:H FILMS FOR APPLICATION IN SOLAR CELLS

Grunow, P., Herm, D, Konenkamp. R., K-ppers, U, Kunst, M., Neitzert, H. C., Werner, A.

Materials Research Society
1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12