Surfactant-Mediated Growth of SiGe/Si Quantum-Well Structures Studied by Photoluminescence Technique and Secondary Ion Mass Spectrometry

Surfactant-Mediated Growth of SiGe/Si Quantum-Well Structures Studied by Photoluminescence Technique and Secondary Ion Mass Spectrometry

Author(s):

Publication title:

Evolution of epitaxial structure and morphology : symposium held November 27-December 1, 1995, Boston, Massachusetts, U.S.A.

Title of ser.:

Materials Research Society symposium proceedings

Ser. no.:

399

Pub. Year:

1996

Page(from):

197

Pub. info.:

Pittsburgh, Pennsylvania: MRS - Materials Research Society

ISSN:

02729172

ISBN:

9781558993020 [1558993029]

Language:

English

Call no.:

M23500/399

Type:

Conference Proceedings

Details

TDL ID:	ZA00018446
Series ID:	PA00000011
Conf. info. (Name):	Symposium on evolution of epitaxial structure and morphology
Conf. info. (Number):	1995
Conf. info. (Venue):	Boston, MA, USA
Conf. info. (Date):	1995.11.27-1995.12.01

Similar Items:

1 Conference Proceedings Photoluminescence Characterization of SiGe/Si Quantum-Well Wire Structures Nilsson, S., Zeindl, H. P., Wolff, A., Pressel, K. MRS - Materials Research Society	7 Conference Proceedings Molecular Secondary Ion Mass Spectrometry Pachuta, Steven J., Cooks, R. Graham American Chemical Society
2 Conference Proceedings Correlation Between Photoluminescence Spectral Features and Crystal Growth Temperature for SiGe Single Quantum Wells Gerling, M., Nilsson, S., Zeindl, H. P., Jagdhold, U. MRS - Materials Research Society	8 Conference Proceedings Photoluminescence of Strain-Engineered MBE-Grown GaN and InGaN Quantum-Well Structures Kruger, Joachim., Kisielowski, Christian, Klockenbrink, Ralf, Sudhir, G. S., Kim, Yihwan, Rubin, Michael, Weber, Eicke … MRS - Materials Research Society
3 Conference Proceedings *SiGe/Si QUANTUM WELLS BY MBE: A PHOTOLUMINESCENCE STUDY Houghton, D.C., Rowell, N.L., Noel, J.-P., Aers, G., Davies, M., Wang, A., Perovic, D.D. Materials Research Society	9 Conference Proceedings Secondary Ion Mass Spectrometry: A Multidimensional Technique Colton, Richard J., Kidwell, David A., Ramseyer, George O., Ross, Mark M. American Chemical Society
4 Conference Proceedings A HIGH DEPTH RESOLUTION BACKSIDE SECONDARY ION MASS SPECTROMETRY TECHNIQUE USED FOR STUDYING METAL/GaAs CONTACTS Palmstrom, C.J., Schwarz, S.A., Marshall, E.D., Yablonovitch, E., Harbison, J.P., Schwartz, C.L., Florez, L., Gmitter, … Materials Research Society	10 Conference Proceedings PHOTOLUMINESCENCE OF SiGe ALLOYS IMPLANTED WITH ERBIUM Erzgraber, H. B., Gaworzewski, P., Schmalz, K., Kruger, D., Morgenstern, T., Osinsky, A., Vatnik, M. MRS - Materials Research Society
5 Conference Proceedings Advances in Characterization of III-Nitrides by Secondary Ion Mass Spectrometry Lierde, P. V., Tian, C., Hockett, R.A., Wei, L., Hockett, D.S., Alejandro, P.C., Keller, S., DenBaars, S.P. Electrochemical Society	11 Conference Proceedings INTERFACE ROUCHNESS OF QUANTUM WELLS STUDIED BY TIME-RESOLVED PHOTOLUMINESCENCE Jiang, H. X., Zhou P., Solin, S. A., Bai, G. Materials Research Society
6 Conference Proceedings Characterization of TiAl Alloys by Secondary Ion Mass Spectrometry Barbosa, J., Teodoro, O.M.N.D., Moutinho, A.M.C., Ribeiro, S., Monteiro, C. Trans Tech Publications	12 Conference Proceedings Measurements of the Diffusion of Iron and Carbon in Single-Crystal NiAl Using Ion Implantation and Secondary Ion Mass Spectrometry Hanrahan, R. J., Jr., Withrow, S. P., Puga-Lambers, M. MRS - Materials Research Society

1

2

3

4

5

6

7

8

9

10

11

12