Blank Cover Image

Sharpness,sharpness-related attributes,and their physical correlates

Author(s):
Nijenhuis,M. ( Institute for Perception Research )
Hamberg,R.
Teunissen,C.
Bech,S.
Jong,H.Looren de
Houben,P.
Pramanik,S.K.
2 more
Publication title:
Very High Resolution and Quality Imaging II
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
3025
Pub. Year:
1997
Page(from):
173
Page(to):
184
Pub. info.:
Bellingham, Wash.: SPIE-The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819424365 [0819424366]
Language:
English
Call no.:
P63600/3025
Type:
Conference Proceedings

Similar Items:

Bech,S., Hamberg,R., Nijenhuis,M., Teunissen,C., Jong,H.Looren de, Houben,P., Pramanik,S.K.

SPIE-The International Society for Optical Engineering

7 Conference Proceedings Correlated photofragmentations

Hsieh,C-H., Lee,S.-H., Fujii,A., Liu,K.

SPIE-The International Society for Optical Engineering

S. Pramanik, S.K. Mitra

Trans Tech Publications

Wong Y-K P., Westlund P., Hamberg M., Granstrom E., Chao H-W P., Samuelsson B.

Plenum Press

Krishna,K.K., Sokhansanj,S., Wood,H.C., Winter,P.W.

SPIE - The International Society for Optical Engineering

Balas,C.J., Stefanidou,M.P., Giannouli,T.C., Georgiou,S.K., Helidonis,E.S., Tosca,A.D.

SPIE-The International Society for Optical Engineering

Boonman, M., van de Vin, C., Tempelaars, S., van Doorn, R., Zimmerman, J., Teunissen, P., Minnaert, A.

SPIE - The International Society of Optical Engineering

Albrecht, M., Christiansen, S., Salviati, G., Zanotti-Fregonara, C., Rebane, Y. T., Shreter, Y. G., Mayer, M., Pelzmann, …

MRS - Materials Research Society

Pankert, J., Bergmann, K., Klein, J., Neff, W., Rosier, O., Seiwert, S., Smith, C., Probst, S., Vaudrevange, D., …

SPIE-The International Society for Optical Engineering

C. L. Tisse, H. P. Nguyen, R. Tessières, M. Pyanet, F. Guichard

Society of Photo-optical Instrumentation Engineers

Okumura,S.K., Chikada,Y., Momose,M.

SPIE - The International Society for Optical Engineering

Ahluwalia,R.S., Jung,J.-Y,

SPIE-The International Society for Optical Engineering

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12