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Characterization of HgCdTe epilayers grown on GaAs(211)B by molecular beam epitaxy

Author(s):
Publication title:
Detectors, focal plane arrays, and applications : 4-5 November 1996, Beijing, China
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
2894
Pub. Year:
1996
Page(from):
224
Page(to):
229
Pub. info.:
Bellingham, Wash., USA: SPIE-The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819422958 [0819422959]
Language:
English
Call no.:
P63600/2894
Type:
Conference Proceedings

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