Blank Cover Image

Built-in self-test for high-speed integrated circuits

Author(s):
Publication title:
Microelectronic Manufacturing Yield, Reliability, and Failure Analysis II
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
2874
Pub. Year:
1996
Page(from):
162
Page(to):
172
Pub. info.:
Bellingham, Wash.: SPIE-The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819422729 [081942272X]
Language:
English
Call no.:
P63600/2874
Type:
Conference Proceedings

Similar Items:

Eden C. R., Welch M. B.

Martinus Nijhoff Publishers

Christou A.

Kluwer Academic Publishers

2 Conference Proceedings *MATERIALS FOR HIGH SPEED CIRCUIT BOARDS

Seibold, R. W., Lamoureux, R. T., Goodman, S. H.

Materials Research Society

X. Xia, L. Xie, W. Sun

Society of Photo-optical Instrumentation Engineers

Kartner, F X, Akiyama, S, Barbastathis, G, Barwicz T, Byun, H, Danielson, D T, Gan, F, Grawert, F, Holzwarth, C W, Hoyt, …

SPIE - The International Society of Optical Engineering

Johnson,J.E., Morton,P.A., Park,Y.K., Ketelsen,L.J.P., Grenko,J.A., Miller,T.J., Sputz,S.K., Tanbun-Ek,T., …

SPIE-The International Society for Optical Engineering

W.-H. Chang, C.G. Shih, J.S. Wang, D. Barlage, M. Feng

Society of Photo-optical Instrumentation Engineers

Koops,H.W.P.

SPIE-The International Society for Optical Engineering

Adonin, A.S., Petrosjanc, K.O., Poljakov, I.V.

SPIE-The International Society for Optical Engineering

Tian,X., Yi,M., Zhang,D., Sun,W., Gao,Y.

SPIE-The International Society for Optical Engineering

W. Piao, Y. Yuan, L. Xu, H. Zhang

Society of Photo-optical Instrumentation Engineers

Mao, L., Chen, Y., Li, W., Chen, M., Liang, H., Zhang, S., Guo, W.

SPIE - The International Society of Optical Engineering

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12