Statistical metrology:understanding spatial variation in semiconductor manufacturing
- Author(s):
- Boning,D.S. ( Massachusetts Institute of Technology )
- Chung,J.E.
- Publication title:
- Microelectronic Manufacturing Yield, Reliability, and Failure Analysis II
- Title of ser.:
- Proceedings of SPIE - the International Society for Optical Engineering
- Ser. no.:
- 2874
- Pub. Year:
- 1996
- Page(from):
- 16
- Page(to):
- 26
- Pub. info.:
- Bellingham, Wash.: SPIE-The International Society for Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819422729 [081942272X]
- Language:
- English
- Call no.:
- P63600/2874
- Type:
- Conference Proceedings
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